The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 10, 2015

Filed:

Oct. 04, 2012
Applicant:

Taiwan Semiconductor Manufacturing Company, Ltd., Hsin-Chu, TW;

Inventors:

Kuan-Chieh Huang, Hsinchu, TW;

Dun-Nian Yaung, Taipei, TW;

Chih-Jen Wu, Hsin-Chu, TW;

Chen-Ming Huang, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 27/00 (2006.01); H01L 31/0232 (2014.01); H01L 21/683 (2006.01); H01L 27/146 (2006.01); H01L 31/18 (2006.01); H01L 23/498 (2006.01); H01L 23/00 (2006.01); H05K 3/34 (2006.01);
U.S. Cl.
CPC ...
H01L 31/0232 (2013.01); H01L 21/6835 (2013.01); H01L 27/14618 (2013.01); H01L 27/14645 (2013.01); H01L 27/14687 (2013.01); H01L 27/14689 (2013.01); H01L 31/18 (2013.01); H01L 23/49805 (2013.01); H01L 24/02 (2013.01); H01L 24/05 (2013.01); H01L 24/16 (2013.01); H01L 24/81 (2013.01); H01L 24/85 (2013.01); H01L 27/14621 (2013.01); H01L 27/14627 (2013.01); H01L 2221/68327 (2013.01); H01L 2221/68363 (2013.01); H01L 2221/68381 (2013.01); H01L 2224/02313 (2013.01); H01L 2224/0239 (2013.01); H01L 2224/024 (2013.01); H01L 2224/0401 (2013.01); H01L 2224/81191 (2013.01); H01L 2224/81801 (2013.01); H05K 3/3436 (2013.01); H05K 2201/10151 (2013.01); H01L 2924/01019 (2013.01); H01L 2924/01087 (2013.01); H01L 2924/01327 (2013.01); H01L 2224/85 (2013.01); H01L 2924/10253 (2013.01); H01L 2924/00014 (2013.01);
Abstract

Provided is a method of fabricating a backside illuminated image sensor that includes providing a device substrate having a frontside and a backside, where pixels are formed at the frontside and an interconnect structure is formed over pixels, forming a re-distribution layer (RDL) over the interconnect structure, bonding a first glass substrate to the RDL, thinning and processing the device substrate from the backside, bonding a second glass substrate to the backside, removing the first glass substrate, and reusing the first glass substrate for fabricating another backside-illuminated image sensor.


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