The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 03, 2015

Filed:

Feb. 13, 2013
Applicant:

International Business Machines Corporation, Armonk, NY (US);

Inventors:

Fen Chen, Williston, VT (US);

Richard Steven Kontra, Williston, VT (US);

Tom C. Lee, Essex Junction, VT (US);

Theodore M. Levin, Winooski, VT (US);

Christopher David Muzzy, Burlington, VT (US);

Timothy Dooling Sullivan, Underhill, VT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/26 (2014.01); H01L 21/66 (2006.01); G11C 13/00 (2006.01); G11C 13/04 (2006.01); H01L 45/00 (2006.01);
U.S. Cl.
CPC ...
G11C 13/0009 (2013.01); G11C 13/0004 (2013.01); G11C 13/004 (2013.01); G11C 13/047 (2013.01); H01L 45/1213 (2013.01); H01L 45/145 (2013.01); G11C 13/04 (2013.01); G11C 2013/0054 (2013.01);
Abstract

A method for changing reflectance or resistance of a region in an optoelectronic memory device. Changing the reflectance of the region includes sending an electric current through the region to cause a reflectance change in the region. Changing the resistance of the region includes: projecting a laser beam at a first beam intensity on the region, resulting in the region changing from a first to a second different resistance value; electrically reading the second resistance value during which an optical signal carried by the laser beam has a first digital value; after electrically reading the second resistance value, the laser beam is projected at a second beam intensity on the region resulting in the region changing from the second to the first resistance value; and electrically reading the first resistance value of the region while the laser beam is being projected on the region at the second beam intensity.


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