The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 27, 2015

Filed:

Jul. 16, 2013
Applicant:

Carsem (M) Sdn. Bhd., Ipoh, MY;

Inventors:

Liew Siew Har, Ipoh, MY;

Law Wai Ling, Ipoh, MY;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/02 (2006.01); H01L 21/60 (2006.01); H01L 21/607 (2006.01); H01L 23/00 (2006.01); B23K 20/00 (2006.01); H01L 23/495 (2006.01); H01L 25/065 (2006.01);
U.S. Cl.
CPC ...
H01L 24/02 (2013.01); H01L 24/85 (2013.01); H01L 24/48 (2013.01); H01L 24/03 (2013.01); B23K 20/007 (2013.01); H01L 23/4952 (2013.01); H01L 2224/48137 (2013.01); H01L 2224/48471 (2013.01); H01L 2224/78301 (2013.01); H01L 24/78 (2013.01); H01L 24/45 (2013.01); H01L 2224/45015 (2013.01); H01L 2224/45144 (2013.01); H01L 2224/45147 (2013.01); H01L 2224/48479 (2013.01); H01L 2224/73265 (2013.01); H01L 2224/85051 (2013.01); H01L 2224/85986 (2013.01); H01L 25/0655 (2013.01); B23K 2201/42 (2013.01);
Abstract

A multi-die package includes a first semiconductor die and a second semiconductor die each having an upper surface with a plurality of bond pads positioned thereon. The multi-die package also includes a plurality of bonding wires each coupling one of the bond pads on the upper surface of the first semiconductor die to a corresponding one of the bond pads on the upper surface of the second semiconductor die. A bonding wire of the plurality of bonding wires includes a first portion extending upward from one of the second plurality of bond pads substantially along a z-axis and curving outward substantially along x and y axes in a direction towards the first semiconductor die. The bonding wire also includes a second portion coupled to the first portion and extending from the first portion downward to one of the first plurality of bond pads on the upper surface of the first semiconductor die.


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