The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 20, 2015

Filed:

Jul. 22, 2011
Applicant:

Joern Weber, Aalen, DE;

Inventor:

Joern Weber, Aalen, DE;

Assignee:

Carl Zeiss SMT GmbH, Oberkochen, DE;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G02B 5/08 (2006.01); G02B 1/10 (2006.01); G03F 7/20 (2006.01); B82Y 30/00 (2011.01);
U.S. Cl.
CPC ...
G02B 5/0891 (2013.01); G02B 1/105 (2013.01); G02B 5/0816 (2013.01); G03F 7/70233 (2013.01); G03F 7/70316 (2013.01); G03F 7/70958 (2013.01); B82Y 30/00 (2013.01);
Abstract

A stress-reduced reflective optical element for a working wavelength in the soft X-ray and extreme ultraviolet wavelength range includes a first multilayer system () of at least two alternating materials () having different real parts of the refractive index at the working wavelength on a substrate (), which exerts a layer stress on the substrate (), and comprising a second multilayer system () of at least two alternating materials () on a substrate (), which exerts an opposed layer stress on the substrate () and is arranged between the first multilayer system () and the substrate (), wherein a first () of the at least two materials of the second multilayer system () is interrupted by layers () having a thickness of up to 1 nm of the at least one further material of the second multilayer system () at such distances that the first material is present in an amorphous state.


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