The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 09, 2014

Filed:

Jun. 13, 2012
Applicants:

Morgan D. Evans, Manchester, MA (US);

Chi-chun Chen, Gloucester, MA (US);

Cheng-huang Kuo, Tainan, TW;

Inventors:

Morgan D. Evans, Manchester, MA (US);

Chi-Chun Chen, Gloucester, MA (US);

Cheng-Huang Kuo, Tainan, TW;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/00 (2006.01); C30B 23/02 (2006.01); C30B 29/40 (2006.01); C30B 25/18 (2006.01);
U.S. Cl.
CPC ...
C30B 23/025 (2013.01); C30B 29/403 (2013.01); C30B 25/186 (2013.01);
Abstract

In one embodiment, a method of growing a heteroepitaxial layer comprises providing a patterned substrate containing patterned features having sidewalls. The method also includes directing ions toward the sidewalls in an exposure, wherein altered sidewall regions are formed, and depositing the heteroepitaxial layer under a set of deposition conditions effective to preferentially promote epitaxial growth on the sidewalls in comparison to other surfaces of the patterned features.


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