The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 04, 2014
Filed:
Jan. 18, 2012
Saeed Bagheri, Croton on Hudson, NY (US);
Fook-luen Heng, Yorktown Heights, NY (US);
Rajiv Vasant Joshi, Yorktown Heights, NY (US);
Kafai Lai, Poughkeepsie, NY (US);
David Osmond Melville, New York, NY (US);
Saibal Mukhopadhyay, Atlanta, GA (US);
Alan E Rosenbluth, Yorktown Heights, NY (US);
Rama N. Singh, Bethel, CT (US);
Kehan Tian, Poughkeepsie, NY (US);
Saeed Bagheri, Croton on Hudson, NY (US);
Fook-Luen Heng, Yorktown Heights, NY (US);
Rajiv Vasant Joshi, Yorktown Heights, NY (US);
Kafai Lai, Poughkeepsie, NY (US);
David Osmond Melville, New York, NY (US);
Saibal Mukhopadhyay, Atlanta, GA (US);
Alan E Rosenbluth, Yorktown Heights, NY (US);
Rama N. Singh, Bethel, CT (US);
Kehan Tian, Poughkeepsie, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
Techniques are presented that include accessing results of forward simulations of circuit yield, the results including at least circuit yield results including simulated device shapes. Using the circuit yield results, high-level traits of at least the simulated device shapes are determined. Based on the determined high-level traits and using the circuit yield results, a compact model for predicted yield is constructed, the compact model including a plurality of adjustable parameters, and the constructing the compact model for predicted yield including adjusting the adjustable parameters until at least one first predetermined criterion is met. An optimization problem is constructed including at least the compact model for yield, an objective, and a plurality of constraints. Using the optimization problem, the objective is modified subject to the plurality of constraints until at least one second predetermined criterion is met.