The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jul. 15, 2011
Applicants:

Karen Amirkhanyan, Yerevan, AM;

Hayk Grigoryan, Yerevan, AM;

Gurgen Harutyunyan, Abovyan, AM;

Tatevik Melkumyan, Yerevan, AM;

Samvel Shoukourian, Yerevan, AM;

Alex Shubat, Los Altos Hills, CA (US);

Valery Vardanian, Yerevan, AM;

Yervant Zorian, Santa Clara, CA (US);

Inventors:

Karen Amirkhanyan, Yerevan, AM;

Hayk Grigoryan, Yerevan, AM;

Gurgen Harutyunyan, Abovyan, AM;

Tatevik Melkumyan, Yerevan, AM;

Samvel Shoukourian, Yerevan, AM;

Alex Shubat, Los Altos Hills, CA (US);

Valery Vardanian, Yerevan, AM;

Yervant Zorian, Santa Clara, CA (US);

Assignee:

Synopsys, Inc., Mountain View, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01); G11C 29/08 (2006.01); G11C 29/10 (2006.01); G11C 11/41 (2006.01);
U.S. Cl.
CPC ...
G11C 29/08 (2013.01); G11C 11/41 (2013.01); G11C 29/10 (2013.01);
Abstract

A method and system for testing an electronic memory. The method includes subjecting the electronic memory to a first test condition of a predetermined set of test conditions. The method also includes testing functionality of the electronic memory, a first plurality of times, for the first test condition using a predetermined test algorithm. The method further includes checking availability of a second test condition from the predetermined set of test conditions if the functionality of the electronic memory is satisfactory. Further, the method includes testing the functionality of the electronic memory, a second plurality of times, for the second test condition using the predetermined test algorithm if the second test condition is available. Moreover, the method includes accepting the electronic memory for use in a product if the functionality of the electronic memory is satisfactory.


Find Patent Forward Citations

Loading…