The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Sep. 24, 2012
Applicant:

Nuflare Technology, Inc, Numazu, JP;

Inventors:

Michihiro Kawaguchi, Shizuoka, JP;

Kazuhiro Shiba, Shizuoka, JP;

Keisuke Yamaguchi, Shizuoka, JP;

Kiminobu Akeno, Kanagawa, JP;

Yoshinori Kagawa, Shizuoka, JP;

Assignee:

NuFlare Technology, Inc., Numazu-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G21K 5/00 (2006.01); G03F 9/00 (2006.01); G21K 5/08 (2006.01); H01L 21/00 (2006.01); G03F 7/00 (2006.01);
U.S. Cl.
CPC ...
G21K 5/08 (2013.01); G03F 9/7096 (2013.01); H01L 21/00 (2013.01); G03F 7/00 (2013.01);
Abstract

A charged particle beam writing apparatus according to one aspect of the present invention includes a substrate cover attachment/detachment unit to attach or detach a substrate cover that covers a whole periphery of a substrate being a writing target from an upper part, to/from the substrate, a writing unit to write a pattern on the substrate, in a state where the substrate cover is attached to the substrate, by a charged particle beam, a position measurement unit, before and after writing by the writing unit, to measure a position of the substrate cover in a state attached to the substrate, at a predetermined measurement position, and a correction unit, with respect to a position of the substrate to which the substrate cover is attached, to correct a positional deviation amount between a position of the substrate cover measured after writing and a position of the substrate cover measured before writing.


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