The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Jun. 13, 2011
Applicants:

Makoto Furuno, Kanagawa, JP;

Takashi Shimazu, Tokyo, JP;

Inventors:

Makoto Furuno, Kanagawa, JP;

Takashi Shimazu, Tokyo, JP;

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/20 (2006.01); H01L 21/36 (2006.01); H01M 4/66 (2006.01); H01L 21/02 (2006.01); H01M 4/13 (2010.01);
U.S. Cl.
CPC ...
H01L 21/02532 (2013.01); H01M 4/664 (2013.01); Y02E 60/122 (2013.01); H01L 21/0262 (2013.01); H01L 21/02603 (2013.01); H01M 4/667 (2013.01); H01M 4/661 (2013.01); H01M 4/13 (2013.01); Y10S 977/72 (2013.01); Y10S 977/811 (2013.01);
Abstract

To provide a method for manufacturing a power storage device which enables improvement in performance of the power storage device, such as an increase in discharge capacity. To provide a method for forming a semiconductor region which is used for a power storage device or the like so as to improve performance. A method for forming a crystalline semiconductor region includes the steps of: forming, over a conductive layer, a crystalline semiconductor region that includes a plurality of whiskers including a crystalline semiconductor by an LPCVD method; and performing heat treatment on the crystalline semiconductor region after supply of a source gas containing a deposition gas including silicon is stopped. A method for manufacturing a power storage device includes the step of using the crystalline semiconductor region as an active material layer of the power storage device.


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