The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 30, 2014

Filed:

Sep. 23, 2011
Applicants:

Peter Baars, Dresden, DE;

Richard Carter, Dresden, DE;

Rolf Stephan, Dresden, DE;

Inventors:

Peter Baars, Dresden, DE;

Richard Carter, Dresden, DE;

Rolf Stephan, Dresden, DE;

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/3205 (2006.01); H01L 21/768 (2006.01); H01L 29/66 (2006.01); H01L 21/285 (2006.01); H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
H01L 21/76897 (2013.01); H01L 21/28518 (2013.01); H01L 29/7848 (2013.01); H01L 29/66545 (2013.01); H01L 21/76814 (2013.01);
Abstract

When forming self-aligned contact elements in sophisticated semiconductor devices in which high-k metal gate electrode structures are to be provided on the basis of a replacement gate approach, the self-aligned contact openings are filled with an appropriate fill material, such as polysilicon, while the gate electrode structures are provided on the basis of a placeholder material that can be removed with high selectivity with respect to the sacrificial fill material. In this manner, the high-k metal gate electrode structures may be completed prior to actually filling the contact openings with an appropriate contact material after the removal of the sacrificial fill material. In one illustrative embodiment, the placeholder material of the gate electrode structures is provided in the form of a silicon/germanium material.


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