The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 16, 2014

Filed:

Apr. 19, 2011
Applicant:

Toshihisa Ozu, Miyagi, JP;

Inventor:

Toshihisa Ozu, Miyagi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/311 (2006.01); H01L 21/8238 (2006.01); H01J 37/32 (2006.01); H01L 29/66 (2006.01); H01L 21/3065 (2006.01); H01L 29/78 (2006.01); H01L 21/768 (2006.01);
U.S. Cl.
CPC ...
H01L 21/3065 (2013.01); H01L 21/823864 (2013.01); H01J 37/32192 (2013.01); H01L 29/6656 (2013.01); H01L 21/31116 (2013.01); H01L 21/823807 (2013.01); H01L 29/6659 (2013.01); H01L 29/7843 (2013.01); H01L 21/76834 (2013.01); H01J 2237/334 (2013.01);
Abstract

An etching method can prevent adverse effects of oxygen plasma from arising under an insulating film when etching the insulating film formed on a substrate. The etching method includes: a first etching step for exposing the insulating film to processing gas that has been turned into a plasma to etch the insulating film to a portion in the thickness direction; a deposition material removing step for exposing the insulating film remaining after completion of the first etching to oxygen plasma to remove deposition material deposited on the surface of the remaining insulating film; and a second etching of exposing the remaining insulating film to processing gas that has been turned into a plasma to etch the remaining insulating film.


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