The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 26, 2014

Filed:

Apr. 05, 2012
Applicants:

Ludovic Godet, Boston, MA (US);

Morgan D. Evans, Manchester, MA (US);

Chi-chun Chen, Gloucester, MA (US);

Inventors:

Ludovic Godet, Boston, MA (US);

Morgan D. Evans, Manchester, MA (US);

Chi-Chun Chen, Gloucester, MA (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/322 (2006.01);
U.S. Cl.
CPC ...
Abstract

A workpiece is implanted to a first depth to form a first amorphized region. This amorphized region is then etched to the first depth. After etching, the workpiece is implanted to a second depth to form a second amorphized region below a location of the first amorphized region. The second amorphized region is then etched to the second depth. The implant and etch steps may be repeated until structure is formed to the desired depth. The workpiece may be, for example, a compound semiconductor, such as GaN, a magnetic material, silicon, or other materials.


Find Patent Forward Citations

Godet, Ludovic. (2014). Method of etching a workpiece (U.S. Patent No. 8815720). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8815720

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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