The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 12, 2014
Filed:
Jun. 30, 2011
Chung-ming Chen, Taipei, TW;
Si-chen Lee, Taipei, TW;
Wan-jou Lee, Taipei, TW;
Che-wei Chang, Taipei, TW;
Yu-chun Chien, Taipei, TW;
Chia-yen Lee, Taipei, TW;
Chung-Ming Chen, Taipei, TW;
Si-Chen Lee, Taipei, TW;
Wan-Jou Lee, Taipei, TW;
Che-Wei Chang, Taipei, TW;
Yu-Chun Chien, Taipei, TW;
Chia-Yen Lee, Taipei, TW;
National Taiwan University, Taipei, TW;
Abstract
This algorithm provides a marker-free approach to establishing the pixel correspondence among the IR images taken at different times, which is the basis for quantitatively characterizing the variation of the heat energy and patterns pixel-wise on a breast surface. The idea is to use the corner points of the heat pattern and the branch points of the skeletons of the heat pattern on the body surface as the initial fiducial points for the longitudinal IR image registration. The Thin-Plate Spline technique is used to model the nonlinear deformation between two IR images taken at two different times. Mutual information between the TPS-transformed image and the target image is employed as the metric quantifying the quality of the longitudinal IR image registration. To optimize the registration, Nelder-Mead simplex method is used to locally modify the pairings of the fiducial points in the source and target IR images to maximize the mutual information.