The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 05, 2014
Filed:
Oct. 14, 2004
Jiro Naka, Tokyo, JP;
Hiroshi Kurokawa, Tokyo, JP;
Junji Kobayashi, Tokyo, JP;
Satoru Toyama, Tokyo, JP;
Noriko Hirano, Tokyo, JP;
Eiji Hara, Tokyo, JP;
Jiro Naka, Tokyo, JP;
Hiroshi Kurokawa, Tokyo, JP;
Junji Kobayashi, Tokyo, JP;
Satoru Toyama, Tokyo, JP;
Noriko Hirano, Tokyo, JP;
Eiji Hara, Tokyo, JP;
Mitsubishi Denki Kabushiki Kaisha, Tokyo, JP;
Abstract
A method for analyzing a minute quantity of a material included in a different material is performed in short extraction treatment without taking a long time and the minute content is rapidly analyzed. The method of analyzing a minute content includes mounting on a sample table a sample piece of a material having a minute content of a different material to be analyzed; dropping onto the sample table a solvent for extracting the minute content from the sample piece, so that the solvent is disposed between the sample table and the sample piece; maintaining at room temperature the solvent between the sample table and the sample piece, and, with the solvent maintained between the sample table and the sample piece, extracting the material of the minute content from the sample piece; and analyzing the content extracted from the sample piece.