The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8786833 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 22, 2014

Filed:

Apr. 15, 2010
Applicants:

Pioter Nikolsky, Veldhoven, NL;

Jozef Maria Finders, Veldhoven, NL;

Remco Jochem Sebastiaan Groenendijk, Eindhoven, NL;

Inventors:

Pioter Nikolsky, Veldhoven, NL;

Jozef Maria Finders, Veldhoven, NL;

Remco Jochem Sebastiaan Groenendijk, Eindhoven, NL;

Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B 27/32 (2006.01); G03B 27/52 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lithographic method includes exposing a first layer of material to a radiation beam to form a first pattern feature in the first layer, the first pattern feature having sidewalls, and a focal property of the radiation beam being controlled to control a sidewall angle of the sidewalls; providing a second layer of material over the first pattern feature to provide a coating on sidewalls of the first pattern; removing a portion of the second layer, leaving a coating of the second layer of material on sidewalls of the first pattern; removing the first pattern formed from the first layer, leaving on the substrate at least a part of the second layer that formed a coating on sidewalls of that first pattern, the part of the second layer left forming second pattern features in locations adjacent to the locations of sidewalls of the removed first pattern feature.


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Nikolsky, Pioter. (2014). Lithographic method and arrangement for manufacturing a spacer (U.S. Patent No. 8786833). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8786833

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