The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Feb. 14, 2013
Applicant:

Texas Instruments Incorporated, Dallas, TX (US);

Inventors:

Mahalingam Nandakumar, Richardson, TX (US);

Brian Hornung, Richardson, TX (US);

Terry James Bordelon, Jr., Flower Mound, TX (US);

Amitava Chatterjee, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of fabricating a Metal-Oxide Semiconductor (MOS) transistor includes providing a substrate having a substrate surface doped with a second dopant type and a gate stack over the substrate surface, and a masking pattern on the substrate surface which exposes a portion of the substrate surface for ion implantation. A first pocket implantation uses the second dopant type with the masking pattern on the substrate surface. At least one retrograde gate edge diode leakage (GDL) reduction pocket implantation uses the first dopant type with the masking pattern on the substrate surface. The first pocket implant and retrograde GDL reduction pocket implant are annealed. After annealing, the first pocket implant provides first pocket regions and the retrograde GDL reduction pocket implant provides an overlap with the first pocket regions to form a first counterdoped pocket portion within the first pocket regions.


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