The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 17, 2014

Filed:

Mar. 15, 2013
Applicant:

Globalfoundries Inc., Grand Cayman, KY;

Inventors:

Andy C. Wei, Queensbury, NY (US);

Dae Geun Yang, Watervliet, NY (US);

Assignee:

GLOBALFOUNDRIES Inc., Grand Cayman, KY;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/336 (2006.01);
U.S. Cl.
CPC ...
Abstract

One method includes forming a plurality of trenches in a semiconducting substrate to define a plurality of fins, forming a layer of overfill material that overfills the trenches, wherein an upper surface of the overfill material is positioned above an upper surface of the fins, forming a masking layer above the layer of overfill material, wherein the masking layer has an opening that is positioned above a subset of the plurality of fins that is desired to be removed and wherein the subset of fins is comprised of at least one but less than all of the fins, performing an etching process through the masking layer to remove at least a portion of the layer of overfill material and expose the upper surface of the subset of fins, and performing a second etching process on the exposed surface of the subset of fins to remove the subset of fins.


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