The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 10, 2014

Filed:

Dec. 21, 2009
Applicants:

Taishi Furukawa, Ayase, JP;

Noriaki Oshima, Ayase, JP;

Kazuhisa Kawano, Ayase, JP;

Hirokazu Chiba, Ayase, JP;

Inventors:

Taishi Furukawa, Ayase, JP;

Noriaki Oshima, Ayase, JP;

Kazuhisa Kawano, Ayase, JP;

Hirokazu Chiba, Ayase, JP;

Assignee:

Tosoh Corporation, Shunan-shi, Yamaguchi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C07F 17/02 (2006.01); B01J 31/00 (2006.01); C07F 15/00 (2006.01); B01J 31/22 (2006.01);
U.S. Cl.
CPC ...
C07F 17/02 (2013.01); C07F 15/0046 (2013.01); B01J 31/2295 (2013.01);
Abstract

This invention aims at providing (2,4-dimethylpentadienyl)-(ethylcyclopentadienyl)ruthenium which may contain its related structure compound, from which a ruthenium-containing thin film can be produced; a method of producing the same; a method of producing the ruthenium-containing thin film using the same; the ruthenium-containing thin film; and the like. The invention relates to producing the thin film using, as a precursor, (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium containing the related structure compound in an amount not more than 5% by weight, which can be obtained by separating the related structure compound from (2,4-dimethylpentadienyl)(ethylcyclopentadienyl)ruthenium containing the related structure compound.


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