The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 18, 2014
Filed:
Jun. 04, 2008
Applicants:
John L. NG, San Jose, CA (US);
Rakesh Krishnaiyer, Milpitas, CA (US);
Alexander Y. Ostanevich, Moscow, RU;
Inventors:
John L. Ng, San Jose, CA (US);
Rakesh Krishnaiyer, Milpitas, CA (US);
Alexander Y. Ostanevich, Moscow, RU;
Assignee:
Intel Corporation, Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 9/45 (2006.01);
U.S. Cl.
CPC ...
Abstract
Methods and apparatus to data dependence testing for loop fusion, e.g., with code replication, array contraction, and/or loop interchange, are described. In one embodiment, a compiler may optimize code for efficient execution during run-time by testing for dependencies associated with improving memory locality through code replication in loops that enable various loop transformations. Other embodiments are also described.