The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Dec. 24, 2013

Filed:

Oct. 26, 2009
Applicants:

Andres Bryant, Burlington, VT (US);

Oki Gunawan, Fair Lawn, NJ (US);

Shih-hsien Lo, Mount Kisco, NY (US);

Jeffrey W Sleight, Ridgefield, CT (US);

Inventors:

Andres Bryant, Burlington, VT (US);

Oki Gunawan, Fair Lawn, NJ (US);

Shih-Hsien Lo, Mount Kisco, NY (US);

Jeffrey W Sleight, Ridgefield, CT (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/84 (2006.01); H01L 21/00 (2006.01); G01P 15/08 (2006.01); G01L 9/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Stress sensors and stress sensor integrated circuits using one or more nanowire field effect transistors as stress-sensitive elements, as well as design structures for a stress sensor integrated circuit embodied in a machine readable medium for designing, manufacturing, or testing an integrated circuit, and related methods thereof. The stress sensors and stress sensor integrated circuits include one or more pairs of gate-all-around field effect transistors, which include one or more nanowires as a channel region. The nanowires of each of the field effect transistors are configured to change in length in response to a mechanical stress transferred from an object. A voltage output difference from the field effect transistors indicates the magnitude of the transferred mechanical stress.


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