The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 29, 2013

Filed:

Mar. 13, 2012
Applicants:

Kuang-jung Chen, Poughkeepsie, NY (US);

Wu-song Huang, Poughkeepsie, NY (US);

Ranee Wai-ling Kwong, Wappingers Falls, NY (US);

Sen Liu, Highland Park, NJ (US);

Pushkara R. Varanasi, Poughkeepsie, NY (US);

Inventors:

Kuang-Jung Chen, Poughkeepsie, NY (US);

Wu-Song Huang, Poughkeepsie, NY (US);

Ranee Wai-Ling Kwong, Wappingers Falls, NY (US);

Sen Liu, Highland Park, NJ (US);

Pushkara R. Varanasi, Poughkeepsie, NY (US);

Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/26 (2006.01); G03F 7/40 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method that forms a film of photoresist composition on a substrate and exposes a first and second region of the film to radiation through a first and second mask having a first and second image pattern, respectively. The photoresist composition includes a polymer including labile group(s), base soluble group(s), a photosensitive acid generator, and a photosensitive base generator. The photosensitive acid generator generates first and second amounts of acid upon exposure to first and second doses of radiation, respectively. The second amount of acid exceeds the first amount of acid. The second dose of radiation exceeds the first dose of radiation. The photosensitive base generator generates a first and second amount of base upon exposure to the first and second dose of radiation, respectively. The first amount of base exceeds the first amount of acid. The second amount of acid exceeds the second amount of base.


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