The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 22, 2013
Filed:
Sep. 10, 2010
Haibo Yao, Slidell, LA (US);
Zuzana Hruska, Covington, LA (US);
Russell D. Kincaid, New Orleans, LA (US);
Thomas E. Cleveland, Mandeville, LA (US);
Robert L. Brown, Prairieville, LA (US);
Haibo Yao, Slidell, LA (US);
Zuzana Hruska, Covington, LA (US);
Russell D. Kincaid, New Orleans, LA (US);
Thomas E. Cleveland, Mandeville, LA (US);
Robert L. Brown, Prairieville, LA (US);
Mississippi State University, Mississippi State, MS (US);
Abstract
A system and method for fluorescence spectral imaging of target material to detect the presence of a contaminant (such as aflatoxin in corn) is provided. An ultraviolet light source is coupled with a light-excluding compartment. The fluorescence from the UV excited target passes through a filter (liquid crystal tunable, acoustic-optic tunable, a filter wheel, or other wavelength splitting device) and a lens, to a spectral imaging camera. Fluorescence spectral image data from the camera are analyzed by a computer and presented in human-readable form. Aflatoxin detection in contaminated corn kernels is based on peak fluorescence and peak fluorescence shift in the spectral range from 451 nm to 500 nm. Aflatoxin contamination level within the target material is quantified based on peak fluorescence and peak fluorescence shift and computed corn kernel pixel statistics.