The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 27, 2013
Filed:
Aug. 24, 2010
Igor Arsovski, Williston, VT (US);
Bruce Balch, Saranac, NY (US);
Umberto Garofano, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
Igor Arsovski, Williston, VT (US);
Bruce Balch, Saranac, NY (US);
Umberto Garofano, Essex Junction, VT (US);
Nazmul Habib, South Burlington, VT (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and device for measuring integrated circuit power supply noise and calibration of power supply noise analysis models. The method includes collecting power supply noise monitor data from an integrated circuit having one or more power supply noise monitors connected between a power supply and respective scan cells of a scan chain and one or more functional circuits connected to the scan chain by scanning a power supply noise generation pattern into the scan chain and scanning a resultant pattern out of the scan chain; converting the resultant data into actual values of selected power supply parameters; generating simulated values of the selected power supply parameters using a power supply noise simulation model based on design data of the integrated chip; comparing the actual values of the selected power supply parameters to the simulated values of the selected power supply parameters; and modifying the power supply noise simulation model based on the comparing.