The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Apr. 22, 2011
Applicants:

Yoshitaka Sasaki, Milpitas, CA (US);

Hiroyuki Ito, Milpitas, CA (US);

Tatsuya Harada, Tokyo, JP;

Nobuyuki Okuzawa, Tokyo, JP;

Satoru Sueki, Tokyo, JP;

Hiroshi Ikejima, Hong Kong, CN;

Inventors:

Yoshitaka Sasaki, Milpitas, CA (US);

Hiroyuki Ito, Milpitas, CA (US);

Tatsuya Harada, Tokyo, JP;

Nobuyuki Okuzawa, Tokyo, JP;

Satoru Sueki, Tokyo, JP;

Hiroshi Ikejima, Hong Kong, CN;

Assignees:

Headway Technologies, Inc., Milpitas, CA (US);

TDK Corporation, Tokyo, JP;

SAE Magnetics (H.K.) Ltd., Hong Kong, CN;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/66 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of manufacturing a layered chip package that includes a main body, and wiring disposed on a side surface of the main body. The main body includes a plurality of layer portions. The method includes fabricating a plurality of substructures, and completing the layered chip package by fabricating the main body using the plurality of substructures and by forming the wiring on the main body. Each substructure is fabricated through the steps of: fabricating a pre-substructure wafer including a plurality of pre-semiconductor-chip portions aligned; distinguishing between a normally functioning pre-semiconductor-chip portion and a malfunctioning pre-semiconductor-chip portion among the plurality of pre-semiconductor-chip portions included in the pre-substructure wafer; and forming electrodes connected to the normally functioning pre-semiconductor-chip portion and having respective end faces located in the side surface of the main body on which the wiring is disposed, without forming any electrode connected to the malfunctioning pre-semiconductor-chip portion.


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