The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 20, 2013

Filed:

Sep. 24, 2002
Applicants:

Katsuyuki Saito, Oak Park, CA (US);

Jar-how Lee, Los Angeles, CA (US);

Lindley Blair, Los Angeles, CA (US);

Inventors:

Katsuyuki Saito, Oak Park, CA (US);

Jar-How Lee, Los Angeles, CA (US);

Lindley Blair, Los Angeles, CA (US);

Assignee:

One Lambda, Canoga Park, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

The invention provides methods for detecting target nucleic acid sequences with diagnostic probes including first and second probe regions that are substantially complementary to first and second target regions respectively on a target nucleic acid strand wherein the first probe region is located 5' to the second probe region. The first probe region is substantially complementary to the first target region, on the target nucleic acid strand, which also includes a second target region, wherein when said first target region is contiguous with the second target region on the target nucleic acid strand, then the first and second probe regions on the diagnostic probe are separated by a spacer region of nucleic acid.


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