The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jul. 23, 2013

Filed:

Jun. 10, 2008
Applicants:

Janos Fucsko, Boise, ID (US);

Niraj B. Rana, Boise, ID (US);

Sandra Tagg, Boise, ID (US);

Robert J. Hanson, Boise, ID (US);

Gundu M. Sabde, Woodbury, MN (US);

Donald L. Yates, Meridian, ID (US);

Patrick M. Flynn, Boise, ID (US);

Prashant Raghu, Boise, ID (US);

Kyle Grant, St. George, UT (US);

Inventors:

Janos Fucsko, Boise, ID (US);

Niraj B. Rana, Boise, ID (US);

Sandra Tagg, Boise, ID (US);

Robert J. Hanson, Boise, ID (US);

Gundu M. Sabde, Woodbury, MN (US);

Donald L. Yates, Meridian, ID (US);

Patrick M. Flynn, Boise, ID (US);

Prashant Raghu, Boise, ID (US);

Kyle Grant, St. George, UT (US);

Assignee:

Micron Technology, Inc., Boise, ID (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/302 (2006.01); H01L 21/461 (2006.01); C03C 15/00 (2006.01); C03C 25/68 (2006.01); B08B 3/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Some embodiments include methods of treating semiconductor substrates. The substrates may be exposed to one or more conditions that vary continuously. The conditions may include temperature gradients, concentration gradients of one or more compositions that quench etchant, pH gradients to assist in removing particles, and/or concentration gradients of one or more compositions that assist in removing particles. The continuously varying conditions may be imparted by placing the semiconductor substrates in a bath of flowing rinsing solution, with the bath having at least two feed lines that provide the rinsing solution therein. One of the feed lines may be at a first condition, and the other may be at a second condition that is different from the first condition. The relative amount of rinsing solution provided to the bath by each feed line may be varied to continuously vary the condition within the bath.


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