The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 25, 2013

Filed:

Jul. 24, 2009
Applicants:

Yoko Futagi, Lawrenceville, NJ (US);

Paul Douglas Deane, Lawrenceville, NJ (US);

Martin Sanford Chodorow, New York, NY (US);

Inventors:

Yoko Futagi, Lawrenceville, NJ (US);

Paul Douglas Deane, Lawrenceville, NJ (US);

Martin Sanford Chodorow, New York, NY (US);

Assignee:

Educational Testing Service, Princeton, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F 17/27 (2006.01);
U.S. Cl.
CPC ...
Abstract

Systems and methods for detecting collocation errors in a text sample using a reference database from a corpus are provided. Collocation candidates are identified within the text sample based upon syntactic patterns in the text sample. Whether a given collocation candidate contains a collocation error is detected, the detecting including: determining a first association measure using the reference database for the given collocation candidate; determining whether the first association measure satisfies a predetermined condition and identifying the given collocation candidate as proper if the first association measure satisfies the predetermined condition; determining an additional association measure for a variation of the given collocation candidate using the reference database; and determining whether or not the collocation candidate contains an error based upon the additional association measure of the variation.


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