The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 07, 2013
Filed:
Aug. 10, 2010
Kazuhiro Yamamoto, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Kazuhiro Yamamoto, Saitama, JP;
Toshiyuki Okayasu, Saitama, JP;
Advantest Corporation, Tokyo, JP;
Abstract
Provided is a measurement apparatus that measures a signal under measurement, comprising a first oscillation circuit that receives one pulse of the signal under measurement and begins oscillating according to the pulse of the signal under measurement to output a first oscillated signal; a second oscillation circuit that receives one pulse of a reference signal and begins oscillating according to the pulse of the reference signal to output a second oscillated signal having a period that is different from a period of the first oscillated signal; and a first sampling section that samples the first oscillated signal according to a pulse of the second oscillated signal. The first oscillation circuit and the second oscillation circuit each include a control section that selects one pulse; a delay section that delays the pulse; and a loop line that feeds the pulse back to an input terminal of the delay section.