The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 12, 2013

Filed:

Feb. 05, 2007
Applicants:

Makiko Irie, Kawasaki, JP;

Takeshi Iwai, Kawasaki, JP;

Inventors:

Makiko Irie, Kawasaki, JP;

Takeshi Iwai, Kawasaki, JP;

Assignee:

Tokyo Ohka Kogyo Co., Ltd., Kawasaki-shi, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G03F 7/028 (2006.01); G03F 7/033 (2006.01); G03F 7/038 (2006.01); G03F 7/26 (2006.01);
U.S. Cl.
CPC ...
Abstract

A resist composition for immersion lithography of the present invention includes a resin component (A) which exhibits changed alkali solubility under the action of acid; and an acid generator component (B) which generates acid on exposure, wherein the resin component (A) includes a resin (A1) containing a fluorine atom and no acid-dissociable group, and a resin (A2) containing a structural unit (a') derived from an acrylic acid and no fluorine atom.


Find Patent Forward Citations

Irie, Makiko. (2013). Resist composition for immersion lithography and method for forming resist pattern (U.S. Patent No. 8394569). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8394569

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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