The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Feb. 05, 2013

Filed:

Nov. 18, 2011
Applicants:

Chan-chi Jason Cheng, Fremont, CA (US);

Qin Wei, San Jose, CA (US);

Ting Yew, San Jose, CA (US);

Inventors:

Chan-Chi Jason Cheng, Fremont, CA (US);

Qin Wei, San Jose, CA (US);

Ting Yew, San Jose, CA (US);

Assignee:

Lattice Semiconductor Corporation, Hillsboro, OR (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 31/28 (2006.01); G11C 29/00 (2006.01); G06F 11/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

In one embodiment, a programmable logic device (PLD) with configuration memory includes at least one configuration memory cell and soft error detection (SED) logic for checking for errors in data stored by the configuration memory. The SED logic calculates a present data value for the configuration memory for comparison with a pre-calculated data value. A fuse within the PLD is configurable in a first logic state to enable the SED logic to read from the configuration memory cell in calculating the present data value and configurable in a second logic state to prevent the SED logic from reading from the configuration memory cell in calculating the present data value. The SED logic may be tested for correct operation by writing data representing a soft error into the configuration memory cell and enabling the SED logic to read from the configuration memory cell in calculating the present data value.


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