The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8350327 B1

PDF
Full Text
Expired
Date of Patent:
Jan. 08, 2013

Filed:

Aug. 28, 2009
Applicants:

Shu-wei Vanessa Chung, Taichung, TW;

Kuo-feng Yu, Hsin-Chu, TW;

Inventors:

Shu-Wei Vanessa Chung, Taichung, TW;

Kuo-Feng Yu, Hsin-Chu, TW;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 29/78 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor device is provided which includes a semiconductor substrate, a gate structure formed on the substrate, sidewall spacers formed on each side of the gate structure, a source and a drain formed in the substrate on either side of the gate structure, the source and drain having a first type of conductivity, a lightly doped region formed in the substrate and aligned with a side of the gate structure, the lightly doped region having the first type of conductivity, and a barrier region formed in the substrate and adjacent the drain. The barrier region is formed by doping a dopant of a second type of conductivity different from the first type of conductivity.


Find Patent Forward Citations

Chung, Shu-Wei. (2013). High voltage device with reduced leakage (U.S. Patent No. 8350327). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8350327

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