The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Aug. 25, 2011
Applicants:

Akihiro Hino, Tsukuba, JP;

Takashi Kodama, Tsukuba, JP;

Mayu Iida, Ohbu, JP;

Hirohito Yamakawa, Fujimino, JP;

Satomi Nozaki, Fujimino, JP;

Katsuyuki Hayakawa, Fujimino, JP;

Inventors:

Akihiro Hino, Tsukuba, JP;

Takashi Kodama, Tsukuba, JP;

Mayu Iida, Ohbu, JP;

Hirohito Yamakawa, Fujimino, JP;

Satomi Nozaki, Fujimino, JP;

Katsuyuki Hayakawa, Fujimino, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C12Q 1/68 (2006.01); C12P 19/34 (2006.01); C07H 21/02 (2006.01); C07H 21/04 (2006.01);
U.S. Cl.
CPC ...
Abstract

A circular DNA is provided comprising endogenous DNA common to both genetically modified wheat and non-genetically modified wheat along with one or more pieces of DNA each having a sequence present specifically in a strain of genetically modified wheat. Also provided is a method for determining a mix rate of genetically modified wheat in a test sample.


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