The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jan. 01, 2013

Filed:

Dec. 22, 2010
Applicant:

James Hermanowski, Waterbury, VT (US);

Inventor:

James Hermanowski, Waterbury, VT (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
B29C 65/00 (2006.01); B29C 63/00 (2006.01); B32B 37/00 (2006.01); B32B 38/00 (2006.01); B65H 1/00 (2006.01); B65G 25/00 (2006.01); B66C 17/08 (2006.01); H01L 21/677 (2006.01); B24B 49/00 (2012.01); B24B 51/00 (2006.01); B24B 1/00 (2006.01); B24B 7/19 (2006.01); B24B 7/30 (2006.01); B24B 3/00 (2006.01); B24B 5/18 (2006.01); B24B 5/00 (2006.01); B24B 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

An improved apparatus for debonding temporary bonded wafers includes a debonder, a cleaning module and a taping module. A vacuum chuck is used in the debonder for holding the debonded thinned wafer and remains with the thinned debonded wafer during the follow up processes steps of cleaning and mounting onto a dicing tape. In one embodiment the debonded thinned wafer remains onto the vacuum chuck and is moved with the vacuum chuck into the cleaning module and then the taping module. In another embodiment the debonded thinned wafer remains onto the vacuum chuck and first the cleaning module moves over the thinned wafer to clean the wafer and then the taping module moves over the thinned wafer to mount a dicing tape onto the wafer.


Find Patent Forward Citations

Loading…