The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 25, 2012
Filed:
Jul. 28, 2009
Masayuki Dohi, Yokohama, JP;
Itsuko Sakai, Yokohama, JP;
Takayuki Sakai, Chofu, JP;
Shunji Kikuchi, Kitakami, JP;
Takuto Inoue, Kitakami, JP;
Akihiro Hori, Oita, JP;
Masayuki Narita, Chigasaki, JP;
Masayuki Dohi, Yokohama, JP;
Itsuko Sakai, Yokohama, JP;
Takayuki Sakai, Chofu, JP;
Shunji Kikuchi, Kitakami, JP;
Takuto Inoue, Kitakami, JP;
Akihiro Hori, Oita, JP;
Masayuki Narita, Chigasaki, JP;
Kabushiki Kaisha Toshiba, Tokyo, JP;
Abstract
An edge detection method includes preparing a transparent substrate which includes a first main face having a first main region and a first peripheral region and a second main face having a second main region and a second peripheral region, the first peripheral region having an inclination angle of θaand the second peripheral region having an inclination angle of θa, causing measuring light to enter the first peripheral region from a direction perpendicular to the first main region, detecting a non-emitting region where the measuring light is not emitted from the second peripheral region, and detecting an edge of the transparent substrate on the basis of the non-emitting region, wherein if a refractive index of the transparent substrate is n, the inclination angles θaand θasatisfy the following expression:sin(θ1+θ2−arcsin(sin θ1/))≧1.