The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 8289508 B1

PDF
Full Text
Expired
Date of Patent:
Oct. 16, 2012

Filed:

Nov. 19, 2009
Applicants:

Victor Seng Keong Lim, Singapore, SG;

Rachel Yie Fang Wai, Singapore, SG;

Fang Hong GN, Singapore, SG;

Liang Choo Hsia, Singapore, SG;

Inventors:

Victor Seng Keong Lim, Singapore, SG;

Rachel Yie Fang Wai, Singapore, SG;

Fang Hong Gn, Singapore, SG;

Liang Choo Hsia, Singapore, SG;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of forming a device is disclosed. The method includes providing a substrate and processing a layer of the device on the substrate. The layer is inspected with an inspection tool for defects. The inspection tool is programmed with an inspection recipe determined from studying defects programmed into the layer at known locations.


Find Patent Forward Citations

Lim, Victor Seng Keong. (2012). Defect detection recipe definition (U.S. Patent No. 8289508). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/8289508

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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