The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 18, 2012
Filed:
Jun. 26, 2008
Krishna Chakravadhanula, Vestal, NY (US);
Patrick Gallagher, Apalachin, NY (US);
Vivek Chickermane, Ithaca, NY (US);
Steven L. Gregor, Owego, NY (US);
Puneet Arora, Delhi, IN;
Krishna Chakravadhanula, Vestal, NY (US);
Patrick Gallagher, Apalachin, NY (US);
Vivek Chickermane, Ithaca, NY (US);
Steven L. Gregor, Owego, NY (US);
Puneet Arora, Delhi, IN;
Cadence Design Systems, Inc., San Jose, CA (US);
Abstract
A method of testing an Integrated Circuit (IC) includes: loading a sequence of data into a chain of circuit elements that hold data values, where outputs of at least some circuit elements are connected to inputs of adjacent circuit elements so values move sequentially through the chain between a chain input for loading values and a chain output for unloading values, and a first circuit element includes a retention element for saving values during power variations related to the IC. The method further includes: saving a value from the data sequence in the retention element; and accessing the retention element for verifying an accuracy of the saved value from the data sequence.