The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 28, 2012
Filed:
May. 30, 2011
Applicants:
Hsiu-chun Lee, Taipei, TW;
Yi-nan Chen, Taipei, TW;
Hsien-wen Liu, Taoyuan County, TW;
Inventors:
Assignee:
Nanya Technology Corp., Kueishan, Tao-Yuan Hsien, TW;
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 21/44 (2006.01); H01L 21/302 (2006.01); H01L 21/461 (2006.01);
U.S. Cl.
CPC ...
Abstract
A method of forming a trench by a silicon-containing mask is provided in the present invention. The method includes providing a substrate covered with a silicon-containing mask. Then, anti-etch dopants are implanted into the silicon-containing mask to transform the silicon-containing mask into an etching resist mask. Later, the substrate and the etching resist mask are patterned to form at least one trench. Next, a silicon-containing layer is formed to fill into the trench. Finally, the silicon-containing layer is etched by taking the etching resist mask as a mask.