The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 01, 2012

Filed:

Dec. 18, 2008
Applicants:

Muhammad E. Abdallah, Houston, TX (US);

Matthew J. Reiland, Oxford, MI (US);

Robert Platt, Houston, TX (US);

Charles W. Wampler, Ii, Birmingham, MI (US);

Brian Hargrave, Dickenson, TX (US);

Inventors:

Muhammad E. Abdallah, Houston, TX (US);

Matthew J. Reiland, Oxford, MI (US);

Robert Platt, Houston, TX (US);

Charles W. Wampler, II, Birmingham, MI (US);

Brian Hargrave, Dickenson, TX (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F 19/00 (2011.01);
U.S. Cl.
CPC ...
Abstract

A system and method for providing multiple priority impedance control for a robot manipulator where impedance laws are realized simultaneously and with a given order of priority. The method includes a control scheme for realizing a Cartesian space impedance objective as a first priority while also realizing a joint space impedance objective as a second priority. The method also includes a control scheme for realizing two Cartesian space impedance objectives with different levels of priority. The method includes instances of the control schemes that use feedback from force sensors mounted at an end-effector and other instances of the control schemes that do not use this feedback.


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