The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 17, 2012
Filed:
Oct. 08, 2008
Cyril Cabral, Jr., Mahopac, NY (US);
Michael S. Gordon, Yorktown Heights, NY (US);
Jeff Mcmurray, Layton, UT (US);
Liesl M. Mcmurray, Legal Representative, Kaysville, UT (US);
Cristina Plettner, Cologne, DE;
Paul Andrew Ronsheim, Hopewell Junction, NY (US);
Cyril Cabral, Jr., Mahopac, NY (US);
Michael S. Gordon, Yorktown Heights, NY (US);
Jeff McMurray, Layton, UT (US);
Liesl M. McMurray, legal representative, Kaysville, UT (US);
Cristina Plettner, Cologne, DE;
Paul Andrew Ronsheim, Hopewell Junction, NY (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A structure and a method for operating the same. The method includes providing a detecting structure which includes N detectors. N is a positive integer. A fabrication step is simultaneously performed on the detecting structure and M product structures in a fabrication tool resulting in a particle-emitting layer on the detecting structure. The detecting structure is different than the M product structures. The M product structures are identical. M is a positive integer. An impact of emitting particles from the particle-emitting layer on the detecting structure is analyzed after said performing is performed.