The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 20, 2011
Filed:
Jul. 02, 2007
Takaya Miyano, Shiga, JP;
Toshiyuki Matsumoto, Hyogo, JP;
Naoki Ikeuchi, Hyogo, JP;
Tsuyoshi Moriya, Yamanashi, JP;
Takaya Miyano, Shiga, JP;
Toshiyuki Matsumoto, Hyogo, JP;
Naoki Ikeuchi, Hyogo, JP;
Tsuyoshi Moriya, Yamanashi, JP;
Ritsumeikan University, Tokyo, JP;
Tokyo Electron Ltd., Tokyo, JP;
Abstract
Provided are a data obtaining section () that obtains a time-series data fluctuating in accordance with the plasma conditions, a translation error calculation section () that calculates a determinism providing an indicator of whether the time-series data in the plasma are deterministic or stochastic, from the time-series data that have been obtained in the data obtaining unit (), and an abnormal discharge determination section () that determines that the plasma is under the abnormal discharge conditions, in the case that the value representing the determinism calculated in the determinism derivation unit is less than or equal to a given threshold value, during the plasma generation. Examples of the value representing the determinism include translation error or permutation entropy. In the case the permutation entropy is used as a value representing the determinism, a permutation entropy calculation section is provided.