The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
Feb. 23, 2010
Ming-hwei Perng, Hsinchu, TW;
Ming-Hwei Perng, Hsinchu, TW;
Test Research, Inc., Taipei, TW;
Abstract
A method for measuring the thickness of a first absorbing material in the presence of a second absorbing material is provided. The method comprises the steps as follow. The thickness (t) of the first absorbing material is fixed and the thickness of the second absorbing material is varied to obtain a calibration standard. The intensity of the transmissive energy passing through the calibration standard is detected by acquiring multiple pairs of image data comprising a foreground value (log(I)) and a background value (log(I)). The thickness (t) of the first absorbing material is changed and the above steps are repeated to obtain sets of image data. A fitting constant Iis determined to describe each set of the intensity data as A best fit of the proportional constant is determined to further calculate an unknown thickness of the first absorbing material (t') through the equation