The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Dec. 13, 2011
Filed:
May. 28, 2004
Naoyuki Koyama, Hitachi, JP;
Youichi Machii, Tsuchiura, JP;
Masato Yoshida, Tsukuba, JP;
Masato Fukasawa, Hitachi, JP;
Toranosuke Ashizawa, Hitachinaka, JP;
Naoyuki Koyama, Hitachi, JP;
Youichi Machii, Tsuchiura, JP;
Masato Yoshida, Tsukuba, JP;
Masato Fukasawa, Hitachi, JP;
Toranosuke Ashizawa, Hitachinaka, JP;
Hitachi Chemical Co., Ltd., Tokyo, JP;
Abstract
A polishing slurry containing a slurry dispersing particles of tetravalent metal hydroxide in a medium therein and an additive, characterized in that the additive is a polymer containing at least one kind of monomer component selected from a group of monomers represented with a general formulae (I) and (II) below (In the general formulae (I) and (II), Rdenotes hydrogen, a methyl group, a phenyl group, a benzil group, a chlorine group, a difluoromethyl group, a trifluoromethyl group or a cyano group, Rand Rdenote hydrogen or an alkyl chain having 1 to 18 carbon atoms, a methylol group, an acetyl group or a diacetonyl group, and a case where both are hydrogen is not included. Rdenotes a morpholino group, a thiomorpholino group, a pyrrolidinyl group or a piperidino group.) The invention provides a polishing slurry in which particles form a chemical reaction layer with a polishing film to be removed with a very small mechanical action of the particles and mechanical removal by a pad without scratches and the additive realizes high planarity.