The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 18, 2011

Filed:

May. 26, 2009
Applicants:

Oliver D. Patterson, Poughkeepsie, NY (US);

Ishtiaq Ahsan, Wallkill, NY (US);

Inventors:

Oliver D. Patterson, Poughkeepsie, NY (US);

Ishtiaq Ahsan, Wallkill, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H01L 23/58 (2006.01);
U.S. Cl.
CPC ...
Abstract

A semiconductor test structure includes a PFET transistor, having a source region, a drain region, a gate disposed between the source region and the drain region, a body disposed under the gate, and a body contact. The source region and drain region float, and the body contact is electrically connected to the body of the PFET transistor and to the ground. This grounds the body of the PFET transistor, and the body contact of the test structure is electrically connected to a capacitor that is electrically connected to ground.


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