The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 04, 2011
Filed:
Jun. 20, 2008
Tatsuya Kobayashi, Takamatsu, JP;
Masato Suzuki, Takamatsu, JP;
Masatoshi Yasutake, Chiba, JP;
Takeshi Umemoto, Chiba, JP;
Tatsuya Kobayashi, Takamatsu, JP;
Masato Suzuki, Takamatsu, JP;
Masatoshi Yasutake, Chiba, JP;
Takeshi Umemoto, Chiba, JP;
AOI Electronics Co., Ltd., Takamatsu-shi, JP;
SII Nano Technology Inc., Chiba-shi, JP;
Abstract
AFM tweezers that include a first probe, including a triangular prism member having a tip of a ridge which is usable as a probe tip in a scanning probe microscope, and a second probe, including a triangular prism member provided so as to open/close with respect to the first probe, are provided. The first probe and the second probe are juxtaposed such that a predetermined peripheral surface of the triangular prism member of the first probe and a predetermined peripheral surface of the triangular prism member of the second probe face substantially in parallel to each other, and the first probe formed of a notch that prevents interference with a sample when the sample is scanned by the tip of the ridge.