The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 23, 2011
Filed:
Oct. 10, 2007
Timothy Roger Robinson, Burland, GB;
Mark Attwood, Cupertino, CA (US);
Xing Chen, Lexington, MA (US);
William M. Holber, Winchester, MA (US);
Mark Philip Longson, Waterhouses, GB;
Jonathan Henry Palk, Sandbach, GB;
Ali Shajii, Canton, MA (US);
John A. Smith, North Andover, MA (US);
Timothy Roger Robinson, Burland, GB;
Mark Attwood, Cupertino, CA (US);
Xing Chen, Lexington, MA (US);
William M. Holber, Winchester, MA (US);
Mark Philip Longson, Waterhouses, GB;
Jonathan Henry Palk, Sandbach, GB;
Ali Shajii, Canton, MA (US);
John A. Smith, North Andover, MA (US);
MKS Instruments, Inc., Andover, MA (US);
Abstract
A system, components thereof, and methods are described for time-of-flight mass spectrometry. A microwave or high-frequency RF energy source is used to ionize a reagent vapor to form reagent ions. The reagent ions enter a chamber and interact with a fluid sample to form product ions. The reagent ions and product ions are directed to a time-of-flight mass spectrometer module for detection and determination of a mass value for the ions. The time-of-flight mass spectrometer module can include an optical system and an ion beam adjuster for focusing, interrupting, or altering a flow of reagent and product ions according to a specified pattern. The time-of-flight mass spectrometer module can include signal processing techniques to collect and analyze an acquired signal, for example, using statistical signal processing, such as maximum likelihood signal processing.