The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7988843 B1

PDF
Full Text
Expired
Date of Patent:
Aug. 02, 2011

Filed:

Feb. 15, 2010
Applicants:

Chung-liang Chang, Hsin-Chu, TW;

Shau-lin Shue, Hsinchu, TW;

Inventors:

Chung-Liang Chang, Hsin-Chu, TW;

Shau-Lin Shue, Hsinchu, TW;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
C25D 5/34 (2006.01);
U.S. Cl.
CPC ...
Abstract

A method of electroplating conductive material on semiconductor wafers controls undesirable surface defects by reducing the electroplating current as the wafer is being initially immersed in a plating bath. Further defect reduction and improved bottom up plating of vias is achieved by applying a static charge on the wafer before it is immersed in the bath, in order to enhance bath accelerators used to control the plating rate. The static charge is applied to the wafer using a supplemental electrode disposed outside the plating bath.


Find Patent Forward Citations

Chang, Chung-Liang. (2011). Method and apparatus for electrochemical plating semiconductor wafers (U.S. Patent No. 7988843). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7988843

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…