The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7978339 B1

PDF
Full Text
Expired
Date of Patent:
Jul. 12, 2011

Filed:

Oct. 04, 2005
Applicants:

Tjarko Adriaan Rudolf Van Empel, Eindhoven, NL;

Marcel Hendrikus Maria Beems, Veldhoven, NL;

Emiel Jozef Melanie Eussen, Eindhoven, NL;

Inventors:
Assignee:

ASML Netherlands B.V., Veldhoven, NL;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B 9/02 (2006.01);
U.S. Cl.
CPC ...
Abstract

A lithographic apparatus includes a position measurement system to determine along a measurement path a position of a first part of the lithographic apparatus with respect to a position of a second part of the lithographic apparatus. The position determination system comprises a plurality of temperature sensors to measure a temperature of a medium along the measurement path. The position measurement system corrects the determined position making use of the temperature as measured by the temperature sensors.


Find Patent Forward Citations

Van Empel, Tjarko Adriaan Rudolf. (2011). Lithographic apparatus temperature compensation (U.S. Patent No. 7978339). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7978339

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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