The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 31, 2011

Filed:

Dec. 29, 2006
Applicants:

Paul Racunas, Marlborough, MA (US);

Srilatha Manne, Seattle, WA (US);

Kypros Constantinides, Ann Arbor, MI (US);

Shubhendu S. Mukherjee, Framingham, MA (US);

Inventors:

Paul Racunas, Marlborough, MA (US);

Srilatha Manne, Seattle, WA (US);

Kypros Constantinides, Ann Arbor, MI (US);

Shubhendu S. Mukherjee, Framingham, MA (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 29/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

Methods and apparatus to efficiently detect faults are described. In an embodiment, an encoded value may be generated based on a portion of an instruction address and a portion of a corresponding result value. The encoded value may be used to determine whether an entry corresponding to the encoded value is absent from a screening storage unit. Other embodiments are also described.


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