The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 12, 2011

Filed:

Jan. 30, 2008
Applicants:

Kan Ota, Bedford, MA (US);

Michael Chen, Danvers, MA (US);

David K. Bernhardt, Hudson, MA (US);

Inventors:

Kan Ota, Bedford, MA (US);

Michael Chen, Danvers, MA (US);

David K. Bernhardt, Hudson, MA (US);

Assignee:

Axcelis Technologies Inc., Beverly, MA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G08B 13/14 (2006.01);
U.S. Cl.
CPC ...
Abstract

The present invention involves a system and method of remotely detecting the presence of a wafer comprising, a passive RFID circuit, wherein the RFID circuit is attached to an end of a transfer arm located inside a vacuum chamber of an ion implantation system, a reader located outside the vacuum chamber, and wherein the RFID tag provides an indication relating to whether or not a wafer is secured by the transfer arm.


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