The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Patent No.:

US 7919859 B1

PDF
Full Text
Expired
Date of Patent:
Apr. 05, 2011

Filed:

Mar. 23, 2007
Applicants:

Ting Zhong, Tigard, OR (US);

Val Dubin, Portland, OR (US);

Mark Bohr, Aloha, OR (US);

Inventors:

Ting Zhong, Tigard, OR (US);

Val Dubin, Portland, OR (US);

Mark Bohr, Aloha, OR (US);

Assignee:

Intel Corporation, Santa Clara, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01L 23/48 (2006.01);
U.S. Cl.
CPC ...
Abstract

Embodiments of the invention include apparatuses and methods relating to copper die bumps with electtomigration cap and plated solder. In one embodiment, an apparatus comprises an integrated circuit die, a plurality of copper bumps on a surface of the die, electromigration(EM) caps substantially covering a mating surface of the copper bumps capable of controlling intermetallic formation between the cooper bumps and solder, and solder plating on the EM caps capable of protecting the EM caps from oxidation prior to packaging.


Find Patent Forward Citations

Zhong, Ting. (2011). Copper die bumps with electromigration cap and plated solder (U.S. Patent No. 7919859). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/7919859

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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